There are a lot of labs out there with electron microscopes. But you don't come to a lab for just a pretty picture. You come for meaningful results. So we at MACS Lab bring a lot to the table. Like the option for you to be present during the microscopy process. Our head analyst has over 27 years of experience. We have high performance equipment. And proven MACS Lab dependability.
Scanning Electron Microscopy (SEM) permits the examination of the surface topography of solid materials. This is useful to characterize surface structure. MACS Lab uses field emission scanning electron microscopes that have the capability of providing clear sharp images at a wide range of accelerating voltages. It is common in SEM to coat the sample with gold or other metals to enhance the surface detail and to reduce the effects of charging. At very high magnification these coatings introduce some artifacts which confuse the true surface information. By using very low accelerating voltages and ignoring backscattered electrons it is possible to image surfaces of even low density organic materials with high accuracy. MACS Lab developed a unique electron detector that reduces but doesn't completely remove all backscattered electrons from the image.
Our electron microscopes are equipped with energy dispersive x-ray analyzers that allow for chemical analysis of structures as small as a few tens of nanometers.
Transmission Electron Microscopy(TEM), like ordinary optical microscopy, allows the viewer to see through a transparent object; the difference is in the magnification provided, which in the TEM is far greater than optical microscopes are capable. This is because the TEM has a much higher resolution than optical microscopes. Images are far from the total capabilites of the TEM. Aditional capabilities include electron diffraction and energy-dispersive x-ray analysis. TEM is generally used in materials science, polymer science, in the plastic packaging and hard disk industries, and where fiber and mineral crystallography are concerned. For example, in polymer science the distribuiton of fillers and polymer alloys in plastic systems can be observed and studied.
Electron diffraction is used in the study of crystallography especially
of very small single crystal samples. Our TEM is equipped with a double
tilt specimen holder. Energy dispersive x-ray analysis is used
to perform chemical analysis of microscopic samples to assist in their
identification. Our TEM is equipped with a micro-spot which is only 100
nanometers in size thus allowing for x-ray spectra of very small objects
If you have questions regarding SEM images or require assistance or
training in electorn microscopy why not visit Stewart
Spiers SSEM consulting services web page.
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